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MM: Fachverband Metall- und Materialphysik
MM 47: Poster Session II
MM 47.37: Poster
Mittwoch, 14. März 2018, 18:30–19:45, Poster C
Quantitative High-resolution and Analytical TEM Investigations of Perovskite Interfaces — •Tobias Meyer1, Patrick Peretzki1, Birte Kressdorf2, Christian Jooß2, and Michael Seibt1 — 1IV. Physical Institute, University Göttingen, Friedrich-Hund-Platz 1, 37077 Göttingen, Germany — 2Institute for Materials Science, University Göttingen, Friedrich-Hund-Platz 1, 37077 Göttingen, Germany
The transmission of sub band gap photons as well as thermalisation losses due to phononic relaxations of hot charge carriers, resulting in the Shockley-Queisser limit of the energy conversion efficiency, are the major theoretical bottlenecks of solar cells based on classical semiconductors. However, strongly correlated materials such as perovskites are a promising candidate to exceed this limit by exploiting the nature of polaronic charge carriers, i.e. the existence of long-living intraband excitations [1]. In fact, the efficiency of halide perovskite based solar cells has increased tremendously during the last decade [2]. Nonetheless, the knowledge about their correlated transport phenomena is rather limited but highly desirable to steer the properties of prospective devices.
We investigate transition-metal oxide perovskite heterojunctions with various Transmission Electron Microscopy (TEM) techniques, i.e. High-resolution and Analytical TEM, to elucidate the character of the charge separating interface. Additionally, differences of focused ion beam and conventionally prepared specimens are discussed.
[1] Ifland, B. et al., New Journal of Physics (2017), 19(6), 063046
[2] W. S. Yang et al., Science 348 (2015), 1234-1237