Berlin 2018 – wissenschaftliches Programm

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MM: Fachverband Metall- und Materialphysik

MM 58: Liquid and Amorphous Metals

MM 58.5: Vortrag

Donnerstag, 15. März 2018, 12:45–13:00, TC 010

Sensitivity for density change detection studied by scanning transmission electron microscopy image simulations — •Sven Hilke, Vitalij Hieronymus-Schmidt, Gerhard Wilde, and Martin Peterlechner — University of Münster, Institute of Materials Physics, Wilhelm-Klemm-Str. 10, 48149 Münster

Amorphous solids and metallic glasses have been in the focus of research for decades. Local diffraction experiments collecting many nano-beam diffraction patterns (NBDP) present a powerful tool to analyze amorphous structures. Recently the methods of Fluctuation Electron Microscopy (FEM) [1] as well as electron correlation microscopy (ECM) [2] were introduced in transmission electron microscopy (TEM). In the present study, the sensitivity of TEM methods to measure missing atoms in solids are analyzed. High angle annular dark field (HAADF) scanning TEM (STEM) is sensitive enough to detect signals of single atoms. It is the aim of this work to show that density changes can be quantitatively analyzed in crystalline silicon and amorphous copper zirconium (Cu64Zr36) by STEMcl [3], a STEM image simulation program.

[1] Voyles, P.M.; Muller, D.A.; Ultramicroscopy (2002), Volume 93, Issue 2, Pages 147-159.

[2] He, L.; Zhang, P.; Besser, M. F.; Kramer, M. J.; Voyles, P. M.; Microscopy and Microanalysis (2015), 21(04), 1026-1033.

[3]Radek, M.; Tenberge, J.-G.; Hilke, S.; Wilde, G.; Peterlechner, M.; Ultramicroscopy (2017), submitted.