Berlin 2018 – wissenschaftliches Programm

Bereiche | Tage | Auswahl | Suche | Aktualisierungen | Downloads | Hilfe

MM: Fachverband Metall- und Materialphysik

MM 70: Topical Session (Symposium MM): Big Data in Materials Science - Managing and exploiting the raw material of the 21st century

MM 70.1: Topical Talk

Freitag, 16. März 2018, 09:30–10:00, H 0107

Transmission Electron Microscopes as a tool generating Big Data: challenges ans opportunities — •Cécile Hébert — LSME, Institut de Physique, Ecole Polytechnique Fédérale de Lausanne, Switzerland

Modern state of the art transmission electron microscopes have become versatile tools fitted with a great variety of detectors. Thanks to tremendous improvement in the stability of components, a single instrument can be operated in various modes. Typically it is possible to operate it in conventional TEM mode or in scanning TEM mode. In TEM mode, cameras are used to reccord images or diffraction patterns. In STEM mode, detectors are used to collect signal as a function of probe position. This signal can be the scattered electrons at various angles, the direct electron beam, eventually analyzed in energy (electron energy loss spectrometry), X-Rays emmited by the specimen or even full diffraction pattern at each probe position. With the ability to scan area of 100 to several 1000 squared pixel, rapid CCD camera (1000 fps) for dynamical experiments, every mid-sized lab can generate data volumes up to petabytes/year. An additional challenge is posed by the fact that several signals are captured by detectors of various brands and delivered in closed undocumented formats. With the current trend towards open science, this poses new challenges but give also opportunities to address the topic on a global level.