Berlin 2018 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 103: Oxide and Insulator Surfaces: Structure, Epitaxy and Growth II
O 103.2: Vortrag
Donnerstag, 15. März 2018, 16:00–16:15, MA 041
High-resolution force mapping on CaF2(111) at 5 K, 77 K, and 300 K in UHV — •Fabian A. Schlage1, Matthias Temmen1, Adam M. Sweetman2, Philip J. Moriarty2, Matt Watkins3, Michael Reichling1, and Philipp Rahe1 — 1Universität Osnabrück, Germany — 2University of Nottingham, UK — 3University of Lincoln, UK
Force maps measured on CaF2 (111) allow a detailed analysis of the atomic contrast formation of frequency shift measurements in non-contact atomic force microscopy and especially enable a quantification of interaction forces acting at the different sample sites. 2D force maps taken at room, liquid nitrogen, and liquid helium temperatures are compared. We analyze in detail forces at the atomic scale derived from the frequency shift maps by deconvolution. With these data, we then develop an interpretation for atomic contrast formation beyond the available models that are mainly based on electrostatic interactions.