Berlin 2018 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 2: Scanning probe techniques: Method development I
O 2.9: Vortrag
Montag, 12. März 2018, 12:30–12:45, MA 004
Compensation method using electrostatic cantilever excitation in electrochemical strain microscopy — •Sebastian Badur, Valon Lushta, Thomas Göddenhenrich, and André Schirmeisen — Institut für Angewandte Physik, Justus-Liebig-Universität Gießen, D-35392
In contact resonance atomic force microscopy such as electrochemical strain microscopy or piezoresponse, the local tip to sample interaction is superimposed by global electrostatic cantilever excitation due to the cantilever capacitance. Especially when using soft cantilevers, topography and mechanical coupling between tip and sample leads to a significant contribution to the electromechanical imaging signal. On the other hand, one can excite the cantilever in a low and high frequency electric field regime to investigate the latter influence. The cantilever resonance response was measured and analyzed by using the band excitation method on the first contact eigenmode. Measurements are performed under UHV condition using cantilevers with electrical conductive diamond tips.
First results on a LiNi0.5Mn1.5O4 substrate show that with this method we can compensate electrostatic and mechanical crosstalk. This paves the way to obtain true quantitative information about the Vegard strain, which is important for the analysis of ionic movement in battery electrode materials.