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O: Fachverband Oberflächenphysik
O 25: Plasmonics and nanooptics: Light-matter interaction, spectroscopy II
O 25.9: Vortrag
Dienstag, 13. März 2018, 12:30–12:45, MA 041
Low-temperature scattering scanning near-field optical microscopy — •Tobias Nörenberg1, Jonathan Döring1, Denny Lang1,2, Susanne C. Kehr1, and Lukas M. Eng1 — 1Technische Universität Dresden, Germany — 2Helmholtz-Zentrum Dresden-Rossendorf, Germany
Scattering scanning near-field optical microscopy (s-SNOM) is a powerful technique to probe the sample’s local dielectric function far beyond the diffraction limit. Applications of s-SNOM include investigations of ferroelectric domains [1], plasmonic resonances [2], superlensing [3], just to name a few. Here, we present a s-SNOM LHe-cryostat setup that uniquely operates from 4 to 300 K [4]. Additionally, we combine this setup with a narrowband free-electron laser for mid-IR to THz sample excitation at λ=4−250 µ m.
This presentation not only answers the technological challenges faced when implementing the low-temperature s-SNOM but, furthermore, also delineates the interesting scientific questions of in situ monitoring phase transitions in multiferroics, or differentiating microscopic phase coexistences and electronic excitations of prospective materials.
J. Döring et al., Appl. Phys. Lett. 105, 053109 (2014).
[2] P. Patoka et al., Opt. Express 24, 1154-1164 (2016).
[3] S. C. Kehr et al., Nat. Comm. 2, 249 (2011).
[4] D. Lang et al., Rev. Sci. Instrum., submitted (2017).