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O: Fachverband Oberflächenphysik

O 29: Metallic nanowires on semiconductor surfaces

O 29.9: Vortrag

Dienstag, 13. März 2018, 12:30–12:45, MA 144

On the diffraction pattern analysis of bundled rare-earth silicide nanowires on Si(001) — Frederic Timmer, Jascha Bahlmann, and •Wollschläger Joachim — Fachbereich Physik, Universität Osnabrück, Osnabrück, Germany

Silicides of trivalent rare earth elemensts form nanowires (NW) on Si(001) surfaces caused by strain effects due to the different crystal structures of Si substrate and silide [1]. After intial growth of 2D wetting layers, single NWs are formed first while NW bundles appear during later stages. Since the structure of the NWs are not correlated, streaks emerge in diffraction pattern. The streaks, however, show some substructure after formation of NW bundles. Here, we report on the analysis of this structure based on the binary surface technique to obtain detailed information on the width distribution of single NWs and bundles of NWs as well as the distribution of bundle distances [2]. We apply our analysis on diffraction pattern from DySi₂ NWs recorded by SPA-LEED and compare the results with previous STM studies [3,4].

[1] M. Dähne, M. Wanka, J. Phys.: Condens. Matter 25 (2013) 014012.

[2] F. Timmer et al., J. Phys.: Condens. Matter 29 (2017) 435304.

[3] B.Z. Liu, J. Nogami, J. Appl. Phys. 93 (2003) 593.

[4] S. Appelfeller et al., Surf. Sci. 641 (2015) 180.