Berlin 2018 – wissenschaftliches Programm

Bereiche | Tage | Auswahl | Suche | Aktualisierungen | Downloads | Hilfe

O: Fachverband Oberflächenphysik

O 49: Poster: Nanostructures on Surfaces I

O 49.17: Poster

Dienstag, 13. März 2018, 18:15–20:30, Poster A

Chemical Analysis of engineered Nanomaterials using Time of Flight Secondary Ion Mass Spectrometry (ToF-SIMS) — •Markus Rennhak, Thomas Heinrich, and Wolfgang E. S. Unger — Bundesanstalt für Materialforschung und -prüfung, Fachbereich 6.1 Oberflächenanalytik und Grenzflächenchemie, Unter den Eichen 87, 12205 Berlin

The analysis of nanomaterials is current an important task - especially in case of risk assessment, as the properties of these material class are not well understood currently. The rather high surface area of these objects renders their interactions significantly different to their corresponding bulk. Thus, the surfaces chemical composition has to be investigated to get a better understanding and prediction of the nanomaterials' behavior. ToF-SIMS has proven as a powerful tool to determine said chemical composition. Its superior surface sensitivity allows us to study mainly the utmost atomic layer and therefore gives us an idea of the interactions involved. Here, we show first result from the validation of the method for the analysis of polystyrene and gold nanoparticles. ToF-SIMS will be compared to other methods like XPS, T-SEM or REM. Furthermore, principle component analysis (PCA) will be used to detect the influence of different sample preparation performed by an innovative microfluidic device. ToF-SIMS imaging is desired to be implemented for single particle detection as well.