Berlin 2018 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 71: Focus Session: Nanoscale Insights into Interfacial Electrochemistry II

O 71.3: Hauptvortrag

Mittwoch, 14. März 2018, 15:30–16:00, HE 101

XPS of ionic liquids: from half-cell to in situ electrochemical measurements — •Annette Foelske-Schmitz¹, Markus Sauer¹, Daniel Weingarth², and Rüdiger Kötz³ — ¹TU Wien, Vienna, Austria — ²Heraeus Holding GmbH, Hanau, Germany — ³Paul Scherrer Institut, Villigen, Switzerland

XPS is widely accepted to be a powerful tool to study electrochemically induced changes of the electrode/electrolyte interface. As electrochemical experiments are commonly performed under atmospheric pressure, XPS is usually not applied directly in the analyser chamber. Therefore, three experimental approaches may be distinguished: (i) ex situ, (ii) quasi in situ, and, (iii) in situ EC XPS [1]. The in situ approach may be realised using UHV compatible electrolytes such as ionic liquids (IL). IL are also known to provide large electrochemical stability windows making them attractive for certain electrochemical applications, such as double layer capacitors or lithium ion batteries. In this contribution quasi in situ [2] and in situ [3] EC XPS setups as well as half-cell measurements of IL [4] will be presented and discussed with respect to investigations of interfacial behaviour, stability windows, and interpretation of XPS data.

[1] A. Foelske-Schmitz, Ref. Mod. Chem., Mol. Sci. Chem. Eng., Elsevier, in press [2] A. Foelske-Schmitz, D. Weingarth, R. Kötz, Electrochim. Acta 56 1032 (2011)[3] D. Weingarth, A. Foelske-Schmitz, A. Wokaun, R. Kötz, Electrochem. Commun. 13 619 (2011)[4] A. Foelske-Schmitz, M. Sauer, JESRP, in press