Berlin 2018 – scientific programme

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O: Fachverband Oberflächenphysik

O 77: Poster: Plasmonics and Nanooptics

O 77.12: Poster

Wednesday, March 14, 2018, 18:15–20:30, Poster A

Imaging of near fields on nanoscopic scale by using Atomic Force Microscopy (AFM) — •Christoph Bauschke, Kai Wardelmann, Sven Kraft, Ingo Barke, and Sylvia Speller — University of Rostock, Institute of Physics, 18059 Rostock, Germany

The optical tweezers phenomenon illustrates, that light is applying an optically induced forces while interacting with matter [1]. Our aim is the determination of optically induced forces by using Atomic Force Microscopy and illumination of metal nanostructures by time-modulated light. A lock-in amplifier serves to determine the share of the cantilever deflection, induced by light. On triangular islands of Au an optically induced effect on the cantilever deflection appears to be present, however this contrast is neither depending on the shape nor fully vanishing during dark phases suggesting other effects being involved. Improvements with respect to embedding of the metal nanostructures, better resonance between laser light and plasmon frequency of nanopartciles, and using more appropriate modulation frequencies are applied. Respective deflection maps could reveal dedicated light-induced features.

[1] Maragò et al., Nature Nanotechnology 8, (2013)