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Berlin 2018 – scientific programme

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O: Fachverband Oberflächenphysik

O 79: Poster: Ultrafast Electron and Spin Dynamics at Interfaces

O 79.9: Poster

Wednesday, March 14, 2018, 18:15–20:30, Poster A

Time-resolved time-of-flight momentum microscopy at femtosecond lab sources — •Eva Sophia Walther1, Tobias Eul1, Florian Haag1,2, Katerina Medjanik3, Gerd Schönhense3, Martin Aeschlimann1, and Benjamin Stadtmüller1,21Department of Physics and Research Center OPTIMAS, University of Kaiserslautern, Germany — 2Graduate School of Excellence Materials Science in Mainz, Germany — 3Institut für Physik, Johannes Gutenberg-Universität Mainz, Germany

Time and angle-resolved photoemission spectroscopy (trARPES) is one of the most important tools to investigate ultrafast carrier dynamics in solids. The largest challenge in trARPES is the small angular acceptance of conventional hemispherical electron analysers which only allows one to image a small part of the Brillouin zone. This limitation can be overcome by momentum microscopy, as recently shown at the free-electron laser FLASH [1]. This technique uses a set of parallel-imaging optics designed for best resolution in k-space. In combination with ToF data recording it allows to collect the photoelectron distribution in the full hemisphere above the sample surface and the complete d-band complex in a single acquisition. Here, we present the first results obtained with our newly commissioned ToF-momentum microscope which was combined with fs-laser light sources. The status of the development will be demonstrated by first 2PPE momentum microscopy data obtained for noble metal surfaces and ferromagnetic thin films. Finally, we will discuss possibilities for ToF-momentum microscopy with fs-XUV light sources. [1] H.-J. Elmers et al., this conference

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