Berlin 2018 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 80: Poster: Scanning Probe Techniques - Method Development

O 80.1: Poster

Mittwoch, 14. März 2018, 18:15–20:30, Poster A

Thermally induced sharpening of tungsten STM-tips — •Timm-Florian Pabst, Hendrik Bettermann, and Mathias Getzlaff — Institute of Applied Physics, Heinrich-Heine-Universität Düsseldorf

Scanning Tunneling Microscopy (STM) allows to investigate structures with a lateral resolution down to the atomic scale. Special attention should be paid to the differing quality or sharpness of the used tip.

The goal of this work is to improve the quality of etched tungsten-STM-tips by using electron-bombardment heating. The resulting sharpness is investigated by testing the tips on tungsten oxide (O − ((1 × 1) × 12)) structure, and FeCo- and Co-nanoparticles deposited on a W(110) surface. The nanoparticles have a size of 3 nm to 9 nm and are produced in situ with a Magnetron Aggregation Source (Haberland type) and an Arc Cluster Ion Source. All measurements are carried out under ultra-high vacuum conditions at room temperature.