Berlin 2018 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 80: Poster: Scanning Probe Techniques - Method Development

O 80.16: Poster

Mittwoch, 14. März 2018, 18:15–20:30, Poster A

Modelling force sensor oscillations for non-contact atomic force microscopy — •Daniel Heile, Philipp Rahe, and Michael Reichling — Universität Osnabrück, Barbarastraße 7, 49076 Osnabrück

The force sensors utilized in non-contact atomic force microscopy are prevalently described by the Euler-Bernoulli beam equation which is commonly analytically solved in the load free, homogeneous case. Furthermore we consider cases, where this analytical approach is not viable any more and introduce the finite differences method (FDM) to describe the force sensor oscillation and dynamics. FDM allows the description of the cantilever oscillations as an eigenvalue problem based on the Euler-Bernoulli beam equation. The results of both approaches are compared for several fundamental cases verifying the reliability of the FDM for force sensor modelling. Based on these results more advanced models, for example coated force sensors, can be considered.