Berlin 2018 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 80: Poster: Scanning Probe Techniques - Method Development

O 80.2: Poster

Mittwoch, 14. März 2018, 18:15–20:30, Poster A

Development of a fibre-based interferometer for an aperturless Scanning Near-field Optical Microscope — •Patrick Pietsch, Jonas Albert, and Markus Lippitz — University of Bayreuth, Bayreuth, Germany.

Aperturless scanning near-field optical microscopy (aSNOM) is a technique to measure the electric near-fields of nanoobjects, such as plasmonic structures, with deep subwavelength resolution. For this purpose an interferometer is required to obtain information on amplitude and phase of the near-field.

We will show how stability and signal-to-noise ratio of these experiments could be improved by using a fibre-based Mach-Zehnder interferometer, instead of a setup based on free space optics. Furthermore we will show, how it helps to increase the ease of use of this experiments.