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O: Fachverband Oberflächenphysik

O 89: Oxide and Insulator Surfaces: Structure, Epitaxy and Growth I

O 89.1: Vortrag

Donnerstag, 15. März 2018, 10:30–10:45, MA 041

High resolution imaging of ultrathin ZnO layers epitaxially grown on Ag(111) using scanning tunneling hydrogen microscopy — •Shuyi Liu¹, Akitoshi Shiotari², Delroy Baugh³, Martin Wolf¹, and Takashi Kumagai¹ — ¹Department of Physical Chemistry, Fritz-Haber Institute of the Max-Planck Society, Germany. — ²Department of Advanced Materials Science, Japan. — ³Department of Chemistry & Biochemistry, University of California, USA.

Ultra-high resolution imaging with a molecular STM/AFM junction has attracted increasing attention as a fascinating tool to resolve sub-molecular structures of adsorbates [1]. Termirow et al. found that molecular hydrogen in an STM junction can enhance the image contrast of planar organic molecules and proposed the idea of scanning tunneling hydrogen microscopy (STHM)[2]. However, the conductivity and mechanical property of the hydrogen junction are imperfectly understood. We apply STHM to image ultrathin ZnO layers epitaxially grown on Ag(111) and the atomic resolution can be obtained in a reproducible manner. We performed the gap distance-dependent conductance measurement and force spectroscopy using STM/AFM, revealing that the junction consists of multiple hydrogen molecules and the enhanced resolution can be achieved at a specific tip-surface distance. A simplified model with two hydrogen molecules in the junction reproduced the distance dependent conductance, force curve and enhanced imaging of ZnO. [1]P. Jelínek J. Phys.: Condens. Matter 29 343002 (2017). [2]R. Temirov et al. New J. Phys. 10, 053012 (2008).