Berlin 2018 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 97: Scanning probe techniques: Method development II

O 97.11: Vortrag

Donnerstag, 15. März 2018, 17:45–18:00, MA 005

Investigation of the significance of higher harmonics in non-contact atomic force microscopy — •Daniel Heile, Alexander von Schmidsfeld, and Michael Reichling — Universität Osnabrück, Barbarastraße 7, 49076 Osnabrück

In the non-contact atomic force microscopy the prevalent theoretical approach to force sensor oscillations is the harmonic approximation. Hence, the complex cantilever oscillations are simplified to a harmonic oscillator at its tip position. This is a sufficient approximation for a cantilever in the freely oscillating case. However, for applied loads on the cantilever, for example due to tip-sample interactions, higher harmonic cantilever modes occur. To describe the dynamics of the cantilever we introduce the finite differences method (FDM) on the basis of the Euler-Bernoulli beam theory. This numerical approach allows the detailed description of the cantilever dynamics under applied loads and hence provides information on the modal structure and frequency spectrum. With that approach the deviation of the tip movement from the sinusoidal harmonic oscillation can be investigated in detail.