Berlin 2018 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 97: Scanning probe techniques: Method development II
O 97.12: Vortrag
Donnerstag, 15. März 2018, 18:00–18:15, MA 005
Information content comparison of mulitfrequency afm methods — •Daniel Platz1, Daniel Forchheimer2, Erik Tholén3, and David B. Haviland2 — 1TU Wien, Gußhausstraße 27-29, A-1040 Vienna, Austria — 2KTH Royal Institute of Technology, Albanova University Center, SE-106 91 Stockholm, Sweden — 3Intermodulation Products AB, Landa Landavägen 4193, SE-823 93 Segersta, Sweden
Dynamic atomic force microscopy (AFM) is one of the key tools for imaging and measuring matter at the nanoscale. In conventional dynamic AFM a small tip at the end of a micro-cantilever oscillates at one frequency above a sample surface. In recent years, several multifrequency methods have been developed to increase the information content of AFM measurements. All these multifrequency methods allow for tip motion comprising multiple frequency components but they are based on different principles like the excitation of multiple cantilever eigenmodes, measurement of higher harmonics of the tip motion or creation of spectral mixing products. Although multifrequency methods have been extensively studied experimentally, it is not well understood how different methods compare. We developed a framework for the consistent comparison of multifrequency AFM methods. The framework is based on the numerical kernel estimation method which allows for an easily understandable interpretation of spectral frequency components. Using this approach, we are able to quantify the information content of different multifrequency AFM methods and to study their robustness to noise.