DPG Phi
Verhandlungen
Verhandlungen
DPG

Erlangen 2018 – scientific programme

Parts | Days | Selection | Search | Updates | Downloads | Help

A: Fachverband Atomphysik

A 25: Poster Session I

A 25.32: Poster

Tuesday, March 6, 2018, 16:15–18:15, Redoutensaal

Electron dynamics in Helium and Neon driven by intense XUV radiation — •Alexander Magunia1, Lennart Aufleger1, T. Ding1, M. Rebholz1, M. Hartmann1, V. Stooß1, P. Rupprecht1, D. Wachs1, C. da Costa Castanheira1, Z. H. Loh2, A. Attar3, S. Düsterer4, G. Brenner4, R. Treusch4, Christian Ott1, and Thomas Pfeifer11Max-Planck Institute for Nuclear Physics, Heidelberg, Germany — 2Nanyang Technological University Singapore, Singapore — 3University of California, Berkeley, USA — 4(DESY), Hamburg, Germany

The measurement of laser-induced dynamics in few-electron systems provides a way to investigate the correlated response of multiple electrons in atoms and molecules when driven by strong and short electric fields. Using a lab-based high-harmonic source we have formerly studied such dynamics via their imprint on the XUV absorption line shape in response to strong fields in the near infrared and visible spectral region. [C. Ott et al., Science 340, 716 (2013)].
Here we present an extension of this scheme to the XUV-only spectral region, using intense and partially coherent light of a Free-Electron Laser (FEL, FLASH@DESY) to investigate the line shape modifications across the 2s2p autoionizing resonance in Helium. The XUV-pulse intensity is in the range from 1012 Wcm-2 to 1014 Wcm-2. These first results are supported by a few-level simulation for which the time-dependent Schrödinger equation is solved numerically, addressing also the statistical SASE-FEL pulse-structure. Furthermore a first view into the strong-field behavior of the multi-electron system Neon is given.

100% | Mobile Layout | Deutsche Version | Contact/Imprint/Privacy
DPG-Physik > DPG-Verhandlungen > 2018 > Erlangen