Erlangen 2018 – wissenschaftliches Programm

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MS: Fachverband Massenspektrometrie

MS 4: New Developments

MS 4.2: Vortrag

Dienstag, 6. März 2018, 14:30–14:45, R 1.020

High-resolution mass separation by transversal contaminant-ion ejection from a multi-reflection time-of-flight device — •Paul Fischer, Stefan Knauer, Gerrit Marx, and Lutz Schweikhard — Institut für Physik, Universität Greifswald, 17489 Greifswald, Germany

Synchronized transversal ejection of unwanted species in an electrostatic ion-beam trap (EIBT) or multi-reflection time-of-flight (MR-ToF) device [1,2,3] has been studied in detail at a new setup at the University of Greifswald [4]. As this separation is performed within the trap, there is no need for additional devices such as ion gates or further traps for either pre- or postselection of ions of interest. Contaminant ions are kicked out by appropriate deflector pulses.

The parameters affecting selection effectivity and resolving power are illustrated with tin-cluster isotopologues. Deflection voltages of 10 V were found to be sufficient for the transversal ejection with as few as three deflection pulses. The duty cycle, i.e. the pulse duration with respect to the period of ion revolution, has been optimized with respect to separation resolving powers, leading to values of up to several tens of thousands.

[1] M. Dahan et al., Rev. Sci. Instrum., 69:76-83(1998).

[2] W. H. Benner, Anal. Chem. 69:4162(1997).

[3] H. Wollnik et al., Int. J. Mass. Spectrom., 96:267-274(1990).

[4] S. Knauer et al., Int. J. Mass. Spectrom., online:

  https://doi.org/10.1016/j.ijms.2017.10.007(2017).