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Q: Fachverband Quantenoptik und Photonik

Q 65: Nano-Optics and Biophotonics

Q 65.6: Vortrag

Freitag, 9. März 2018, 11:45–12:00, K 0.023

Multi-pass (electron) microscopy for low damage imaging applications. — •Thomas Juffmann — Ecole Normale Superieure, Paris, France

Specimen damage is often a limiting factor when it comes to imaging biological specimens (e.g. in cryogenic electron microscopy or optical live-cell imaging). Improved sensitivity and spatial resolution can be obtained employing quantum measurement strategies. A technologically viable and quantum optimal approach to measuring small phase shifts is to pass each probe particle through the specimen multiple times. Employing self-imaging cavities, this idea can be applied to widefield microscopy. We show post-selected optical birefringence and absorption measurements beyond the single pass shot-noise limit and discuss the applicability of multi-pass microscopy to cryo-EM. Our EM simulations show that multi-pass TEM allows for a tenfold damage reduction in imaging small proteins.