Würzburg 2018 – wissenschaftliches Programm

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AKBP: Arbeitskreis Beschleunigerphysik

AKBP 4: Diagnostics, Control and Instrumentation

AKBP 4.1: Vortrag

Dienstag, 20. März 2018, 16:30–16:45, NW-Bau - HS4

Characterization of a compact and calibratable von-Hamos X-Ray Spectrometer based on full-cylindrical HAPG mosaic crystals — •Malte Wansleben, Yves Kayser, Ina Holfelder, and Burkhard Beckhoff — Physikalisch-Technische Bundesanstalt

The further development of more complex nano-materials and thin film applications with distinct properties need an analysis independent from any reference material. A method of choice could be X-ray emission spectroscopy (XES). A reliable quantitative and moreover reference-free XES approach, however, requires calibrated instrumentation.

We would like to present a high-resolution wavelength-dispersive spectrometer for XES in the energy range of 2.3 keV to 20.0 keV. Making use of two full-cylindrical Highly Annealed Pyrolytic Graphite (HAPG) crystals as dispersive elements in a modified von-Hamos geometry a large solid angle of detection and hence high efficiency is realized. HAPG is a synthetic type of carbon which forms mosaic crystals. Although the peak reflectivity is smaller than in perfect crystals, the diffraction profile of this mosaic crystal is much wider leading to an increased integrated reflectivity. This work shows the characterization of the spectrometer including mosaicity and integrated reflectivity measurements on the HAPG optics, achievable energy resolution and relative efficiency of the device. Furthermore, the chemical speciation capability of the device is demonstrated with different binary titanium and iron compounds.