Würzburg 2018 – scientific programme
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T: Fachverband Teilchenphysik
T 25: Silizium-Streifen-Detektoren II / Pixel-Detektoren
T 25.5: Talk
Tuesday, March 20, 2018, 17:30–17:45, Philo-HS2
Beam induced background measurements with the semiconductor tracking detector at ATLAS — Saverio D'Auria1, •Jihyun Jeong2, and Christian Sander2 — 1University of Glasgow, UK — 2DESY, Hamburg, Germany
The beam induced background is one of the important backgrounds in mono-jet analysis and searches for new particle with a disappearing track signature. Therefore, understanding the characteristics of beam induced background is crucial to estimate and reject this background.
In this talk, the analysis of the beam induced background of the data recorded in 2016 is presented. To enrich the events from beam induced background, the unpaired and isolated proton bunches are used. The events are selected by two different triggers: one is using the beam condition monitor which is a diamond detector close to the beam pipe, and another one is making a requirement on the minimum number of hits in the semiconductor tracking detector(SCT) end-cap disks. Furthermore, the triggered events are selected at analysis level by the asymmetric hit distribution in the SCT end-cap disks.
The trigger rates and the beam induced background selection rates are discussed, and additionally the interaction between collision debris and the detector material, so called afterglow, is presented.