T 41: Halbleiterdetektoren / Strahlenhärte I
Tuesday, March 20, 2018, 16:30–19:00, Z6 - SR 2.010
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16:30 |
T 41.1 |
Direct Measurement of Optical Cross-Talk in SiPMs Using Light Emission Microscopy — •Derek Strom, Razmik Mirzoyan, and Jürgen Besenrieder
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16:45 |
T 41.2 |
Direct temperature measurement of SiPMs via IV diode characteristics — •Naomi Vogel, Michael Wagenpfeil, Sebastian Schmidt, Tobias Ziegler, and Thilo Michel
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17:00 |
T 41.3 |
Characterization of SiPMs after radiation damage — •Sara Cerioli, Erika Garutti, Robert Klanner, David Lomidze, Joern Schwandt, and Milan Zvolsky
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17:15 |
T 41.4 |
Annealingverhalten von bestrahlten p-Typ Streifendetektoren — •Leena Diehl, Riccardo Mori, Ines Messmer, Marc Hauser, Ulrich Parzefall und Karl Jakobs
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17:30 |
T 41.5 |
Labormessungen von bestrahlten und unbestrahlten Reinerstrukturen — Silke Altenheiner, Sascha Dungs, Andreas Gisen, Claus Gößling, Valerie Hohm, Reiner Klingenberg, Kevin Kröninger, •Anna-Katharina Raytarowski und Mareike Weers
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17:45 |
T 41.6 |
The GeMSE Low-Background Facility for Meteorite and Material Screening — •Diego Ramírez García
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18:00 |
T 41.7 |
Shallow angle measurements on prototypes for the CMS Phase II pixel sensors — •Caroline Niemeyer, Aliakbar Ebrahimi, Finn Feindt, Erika Garutti, Daniel Pitzl, Jörn Schwandt, Georg Steinbrück, and Irene Zoi
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18:15 |
T 41.8 |
Modulbauentwicklung für das Phase-II-Upgrade des äußeren CMS-Spurdetektors — Tobias Barvich, Alexander Dierlamm, Ulrich Husemann, •Stefan Maier und Marius Neufeld
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18:30 |
T 41.9 |
Enhanced lateral drift sensors: concept and development — •Anastasiia Velyka and Hendrik Jansen
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18:45 |
T 41.10 |
Optimization of bias rail implementations for segmented silicon sensors — Marta Baselga, Alexander Dierlamm, Thomas Müller und •Daniel Schell
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