Aachen 2019 – wissenschaftliches Programm
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T: Fachverband Teilchenphysik
T 20: Detektorsysteme I
T 20.5: Vortrag
Montag, 25. März 2019, 17:00–17:15, ST 4
Optimization of Belle II DEPFET Pixel Sensor Biasing — •Philipp Wieduwilt, Harrison Schreeck, Julian Soltau, Benjamin Schwenker, and Ariane Frey — Georg-August-Universität Göttingen
The Belle II experiment at the Japanese B-Factory SuperKEKB will start taking data in early 2019. The SuperKEKB e+e− collider runs at a very high peak luminosity of 8·1035cm−2s−1 at the Υ(4S) resonance, producing B mesons. In order to reconstruct the decay vertices of the B mesons in this harsh environment, the Belle II detector will be equipped with a DEPFET based silicon pixel detector (PXD). The silicon bulk, on which the field-effect transistors form the individual pixels, is biased by different voltages enabling bulk depletion, charge collection and charge removal.
The base constituents of the PXD are half-ladders of a 768×256 sensitive DEPFET pixel matrix and front-end read-out ASICs. The PXD design consists of two layers (12 ladders in the outer layer, 8 ladders in the inner layer) with four different pixel pitches of 55×50 µm2 to 85×50,µm2. This talk will present observations on characterization of the final PXD half-ladders, as well as studies for finding the optimal sensor biasing scheme.