DS 1: Optical Analysis of Thin Films I (Reflection, Ellipsometry, Raman, IR-DUV Spectroscopy, ...
Montag, 1. April 2019, 09:30–11:45, H32
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09:30 |
DS 1.1 |
Hauptvortrag:
Charge and ion exchange at electrochemical interfaces: atomistic insights by means of in-situ ellipsometry — •Christoph Cobet
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10:00 |
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15 min. break
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10:15 |
DS 1.2 |
Sensing and structure analysis by in situ IR spectroscopy: From ml flow cells to microfluidic applications — •Karsten Hinrichs, Lucjan Grzegorzewski, Andreas Furchner, and Christoph Kratz
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10:30 |
DS 1.3 |
Reflectance Anisotropy Spectroscopy as an analytical tool for phase transformation studies: order reactions in Cu-Au Thin Films — •Marco Volpi, Alla Sologubenko, Philipp Okle, and Ralph Spolenak
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10:45 |
DS 1.4 |
Direct band gap of alpha-tin investigated by infrared ellipsometry — Rigo A. Carrasco, Cesy M. Zamarripa, •Stefan Zollner, and Jose Menendez
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11:00 |
DS 1.5 |
Temperature induced changes in monolayers observed by sum frequency generation spectroscopy — •Damian Firla, Robert Rameker, Joshua Multhaup, and Eckart Hasselbrink
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11:15 |
DS 1.6 |
Raman spectroscopy characterization of silicon nanoribbons on Ag(110) — •Dmytro Solonenko, Alexander Ehm, Dietrich R.T. Zahn, and Patrick Vogt
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11:30 |
DS 1.7 |
Revealing the distinct structural and plasmonic properties of gold nanosponges through FIB nanotomographical reconstruction — •Peter Schaaf, Lars Hauke Honig, and Dong Wang
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