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DS: Fachverband Dünne Schichten

DS 14: Poster

DS 14.30: Poster

Dienstag, 2. April 2019, 17:00–20:00, Poster E

Investigations of LaVO₃ and PrVO₃ thin films by Raman spectroscopy and ellipsometry — Simon Brehm¹, •Cameliu Himcinschi¹, Ionela Lindfors-Vrejoiu², Kumar Deepak³, Wilfrid Prellier³, and Jens Kortus¹ — ¹Institute of Theoretical Physics, TU Bergakademie Freiberg, 09596 Freiberg, Germany — ²II. Physikalisches Institut, Universität zu Köln, D-50937, Germany — ³Laboratoire CRISMAT, CNRS-ENSICAEN, F-14050 Caen, France

In this work, 3d transition metal vanadates (LaVO₃ and PrVO₃) thin films grown by pulsed-laser deposition on different crystalline substrates (DyScO₃, LSAT, LaGaO₃, SrTiO₃) were investigated. The phase transition to orbital ordering of the films was evaluated by Raman spectroscopy. For this purpose, temperature-dependent measurements were carried out in a range of 90 K to 300 K using 633 nm laser line as excitation. The dependence of the orbital ordering on the film orientation on the different substrates was addressed. Additionally, spectroscopic ellipsometry was used to determine the optical constants of the LaVO₃ and PrVO₃ thin films at room temperature.