Regensburg 2019 – wissenschaftliches Programm
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DS: Fachverband Dünne Schichten
DS 16: Organic Thin Films, Organic-Inorganic Interfaces
DS 16.6: Vortrag
Mittwoch, 3. April 2019, 10:45–11:00, H39
Measuring and Modelling Electric Potential Distributions at Organic Semiconductor Interfaces — •Markus Frericks1,2, Christof Pflumm3, Wolfram Jaegermann1,2, and Eric Mankel1,2 — 1Technische Universität Darmstadt, Darmstadt — 2InnovationLab, Heidelberg — 3Merck KGaA, Darmstadt
Photoelectron spectroscopy (PES) is an important characterization method in the field of semiconductor physics. Consecutive deposition of thin layers of an adsorbate on a substrate monitored by PES allows for an analysis of the electronic structure at semiconductor interfaces. For organic semiconductors (OSCs), several publications, e.g. [1], indicate that the key to understand contact formation and doping mechanisms lies in the disorder of organic molecules and its influence on the density of states (DOS). Supporting this idea, we developed a model based on the ones presented by Salzmann et. al. and Lange et. al. [1,2] to numerically calculate the potential distribution at OSC interfaces. Combining these calculations with the approach of Ohashi et. al. [3] to simulate PES data, we derived an algorithm to fit the results of above-mentioned type of interface experiment. By this means, we obtained a tool that supports the importance of the DOS and allows for further investigations on its influence and behavior at contacts. After presenting the procedure, we will demonstrate its applicability on the results of interface experiments with differently doped hole transport materials.
[1] Salzmann et. al., Acc. Chem. Res. 49 (2016) [2] Lange et. al., PRL 106 (2011) [3] Ohashi et. al., Appl. Phys. Lett. 101 (2012)