Regensburg 2019 – wissenschaftliches Programm

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DS: Fachverband Dünne Schichten

DS 22: Thin Film Applications

DS 22.6: Vortrag

Donnerstag, 4. April 2019, 11:00–11:15, H39

High resolution fast X-ray reflectivity data acquisition — •Milena Lippmann, Anita Ehnes, and Oliver Seeck — DESY, Hamburg

A new method for fast x-ray reflectivity data acquisition is presented. The method is based on a fast rotating, slightly tilted sample reflecting to a stationary mounted position sensitive detector and it allows for measurements of reflectivity curves in a quarter of a second. The resolution in q-space mainly depends on the beam properties and the pixel size of the detector. Maximum qz-value of 1 A-1 can be achieved. The time-temperature depending structure changes of poly(N-isopropylacrylamide) (PNIPAM) thin films were investigated in situ by applying the fast-reflectivity setup.