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DS: Fachverband Dünne Schichten

DS 24: Thin Film Properties: Structure, Morphology and Composition (XRD, TEM, XPS, SIMS, RBS, AFM, ...) Part I

DS 24.12: Vortrag

Donnerstag, 4. April 2019, 18:00–18:15, H39

Chemical order in Heusler thin films determined by X-ray diffraction — •Dominik Kriegner¹, Anastasios Markou¹, Peter Swekis¹, Joerg Grenzer², and Claudia Felser¹ — ¹Max Planck Institute for Chemical Physics of Solids, Dresden, Germany — ²Helmholtz-Zentrum Dresden-Rossendorf, Institute of Ion Beam Physics and Materials Research, Dresden, Germany

The chemical order of Heusler materials largely determines their physical properties [1]. For bulk materials powder diffraction with X-rays and neutrons are established tools to determine the chemical order and potential disorder between various lattice sites in Heusler compounds. On the other hand for epitaxial thin films due to the low sample volume and more complicated measurement geometries for the diffraction experiments the established models for polycrystals do only apply with modifications. Using a coplanar diffraction geometry we show how experimental data have to be collected and how corrections (for the diffraction geometry) have to be applied that common poly-crystal models can be used to determine the chemical order of cubic Co₂MnGa [2] and tetragonal MnPtSn compounds thin film [3].

[1] C. Felser, A. Hirohata (Eds.) Heusler Alloys, Properties, Growth, Applications; Springer Series in Materials Science [2] H. Reichlova, et al. Appl. Phys. Lett. 113, 212405 (2018) [3] P. Swekis, et al. submitted