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09:30 |
DS 25.1 |
Reducing residual stress and dislocation density in AlN films grown on SiC by MOCVD for UV-C LED applications — •Christian J. Zollner, Abdullah Almogbel, Burhan Saif Addin, Michael Iza, Steven P. DenBaars, James S. Speck, and Shuji Nakamura
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09:45 |
DS 25.2 |
Mass separated low-energy nitrogen ion assisted thin film growth — •Michael Mensing, Philipp Schumacher, Christoph Grüner, Jürgen W. Gerlach, and Bernd Rauschenbach
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10:00 |
DS 25.3 |
Valence profiling of LaMnO3/SrTiO3 by use of resonant X-ray reflectometry and crystal field theory — •Michael Dettbarn, Volodymyr B. Zabolotnyy, Robert Green, Michael Zapf, Kirill Miller, Matthias Schmitt, Enrico Schierle, Michael Sing, Ralph Claessen, and Vladimir Hinkov
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10:15 |
DS 25.4 |
HAXPES study of oxygen vacancies forming in thin film HfO2-based MIM structures — •Thomas Szyjka, Ronja Hinz, Mai Hussein, Paul Rosenberger, Marek Wilhelm, Terence Mittmann, Uwe Schröder, and Martina Müller
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10:30 |
DS 25.5 |
X-ray spectroscopic composition analysis of amorphous ZnSnOy grown by magnetron sputtering — •Ainur Zhussupbekova, Aitkazy Kaisha, Karsten Fleischer, Igor V. Shvets, and David Caffrey
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10:45 |
DS 25.6 |
MBE growth of oxide thin films on silicon — •Luqman Mustafa
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11:00 |
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15 min. break.
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11:15 |
DS 25.7 |
Orbital character of the mobile and localized electron states at the LAO/STO interface — •Alla Chikina, Frank Lechermann, Marius-Adrian Husanu, Marco Caputo, Claudia Cancellieri, Thorsten Schmitt, Milan Radovic, and Vladimir N. Strocov
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11:30 |
DS 25.8 |
PFM and SHG study of ferroelastic twin domain crossings in PbZr0.2Ti0.8O3 — •Philippe Tückmantel, Grégory Taupier, Kokou D. Dorkenoo, Joshua C. Agar, Lane W. Martin, Patrycja Paruch, and Salia Cherifi-Hertel
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11:45 |
DS 25.9 |
Topotactic transition mechanisms in SrCoO2.5+x films — •Patrick Schöffmann, Sabine Pütter, Anirban Sarkar, Amir Syed-Mohd, Markus Waschk, Tanvi Bhatnagar, Paul Zakalek, and Thomas Brückel
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12:00 |
DS 25.10 |
Effect of Interfaces in the Oxide Transport Process in Platinum Coated Porous Frameworks of Yttria-Stabilized Zirconia (YSZ) — •Michele Bastianello, Jan-Ove Söhngen, and Matthias T. Elm
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12:15 |
DS 25.11 |
Structure evolution of hydrogenated TiO2 by means of Perturbed Angular Correlation — •Dmitry Zyabkin, Juliana Schell, Ulrich Vetter, and Peter Schaaf
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12:30 |
DS 25.12 |
Epitaxial growth of Ba2SiO4 thin films on Si(001) — •Julian Koch and Herbert Pfnür
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