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DS: Fachverband Dünne Schichten
DS 25: Thin Film Properties: Structure, Morphology and Composition (XRD, TEM, XPS, SIMS, RBS, AFM, ...) Part II
DS 25.10: Vortrag
Freitag, 5. April 2019, 12:00–12:15, H32
Effect of Interfaces in the Oxide Transport Process in Platinum Coated Porous Frameworks of Yttria-Stabilized Zirconia (YSZ) — •Michele Bastianello1, Jan-Ove Söhngen1, and Matthias T. Elm1,2,3 — 1Center for Materials Research, Justus-Liebig-University Gießen, Germany, Heinrich-Buff-Ring 16, 35392 Gießen — 2Institute of Experimental Physics I, Justus-Liebig-University Gießen, Germany, Heinrich-Buff-Ring 16, 35392 Gießen — 3Institute of Physical Chemistry, Justus-Liebig-University Gießen, Germany, Heinrich-Buff-Ring 17, 35392 Gießen
Mixed ionic and electronic conductors (MIEC) are used for many applications, i.e. as electrolyte for oxygen separation membranes. Here we present the preparation of artificial MIECs. Different YSZ-Pt-YSZ multilayered thin films were prepared as model systems using pulsed laser deposition (PLD) together with porous YSZ thin films subsequently coated with a thin layer of metallic platinum using atomic layer deposition (ALD). The as-prepared materials were structurally charachterized using grazing incidence X-ray diffraction (GIXRD) and scanning electron microscopy (SEM). The electrical transport properties were investigated performing electrochemical impedance spectroscopy (EIS) at different temperatures and oxygen partial pressures to determine the conductivity as well as the activation energy of the thin films.