DS 7: Optical Analysis of Thin Films II (Reflection, Ellipsometry, Raman, IR-DUV Spectroscopy, ...
Monday, April 1, 2019, 15:00–16:15, H32
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15:00 |
DS 7.1 |
Topology Related Phenomena in Anisotropic Organic Microcavities — •Ota Kunt, Markas Sudzius, Hartmut Fröb, and Karl Leo
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15:15 |
DS 7.2 |
Structural Color Sensors: Tracking the Thermal History of Materials — •Henning Galinski, Volker Schnabel, Max Döbeli, and Ralph Spolenak
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15:30 |
DS 7.3 |
The influence of deposition conditions on the continuous broad sub-bandgap-absorption of the High Entropy Oxide: MgCoNiCuZn-O — •Lars Wenning and Emeline Michel
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15:45 |
DS 7.4 |
Optical properties along the pseudo-binary line between Bi2Se3 and Sb2Se3 — •Ludovica Guarneri, Stefan Maier, and Matthias Wuttig
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16:00 |
DS 7.5 |
Tailoring the optical properties of atomically-thin tungsten disulfide via ion irradiation — •Linan Ma, Yang Tan, Mahdi Ghorbani-Asl, Shengqiang Zhou, Arkady V Krasheninnikov, and Feng Chen
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