Regensburg 2019 – scientific programme

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DY: Fachverband Dynamik und Statistische Physik

DY 7: Interfaces and Thin Films (joint session CPP/DY)

DY 7.8: Talk

Monday, April 1, 2019, 17:00–17:15, H14

An Extended Transfer Matrix Approach to Calculate the Scattering of Light in an Interface Profile — •Reinhard Sigel — 83301 Traunreut

The transfer matrix method is a reliable work horse for the calculation of the reflection at an interface profile. In this contribution, the approach is extended by additional fluctuations Δε of the relative permittivity ε within the profile, which cause light scattering. For small amplitudes, such fluctuations can be treated within the first Born approximation. The incident light as well as the exit of the scattered light through the layered profile are handled by the transfer matrix method. Based on a model which yields the interface profile and the fluctuation amplitudes, the intensity and the polarization properties of the light scattered in any solid angle are predicted. Applications to grazing incidence small angle X-ray scattering (GISAXS), evanescent wave dynamic light scattering (EWDLS) and scattering ellipsometry are discussed.