Regensburg 2019 – scientific programme

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KFM: Fachverband Kristalline Festkörper und deren Mikrostruktur

KFM 6: Focus: Advanced TEM spectroscopy - low energy excitations and chemical composition at high resolution (joint session KFM/HL)

KFM 6.7: Talk

Monday, April 1, 2019, 17:40–18:00, PHY 5.0.20

Spectroscopic coincidence experiments in Transmission Electron Microscopy — •Daen Jannis¹, Knut Müller-Caspary¹, Armand Béché¹, Andreas Oelsner², and Jo Verbeeck¹ — ¹EMAT, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerpen, Belgium — ²Surface Concept GmbH, Am Sägewerk 23a, 55124 Mainz, Germany

Modern transmission electron microscopes are often equipped with EELS and EDX spectrometers. Both measurement techniques share the fact that excitations of atomic states are involved. Indeed, there is for every emitted X-ray photon at least one electron that transfers a part of its energy to excite the atom in the first place, and therefore one could imagine that they convey very similar information. Since the two signals originate from the same process, the temporal correlation between these signals can be measured. Our current setup consists of a novel delay line detector setup for EELS and a Super-X EDX detector. These allow to detect the energy and arrival time (time resolution 270 ns) of every incoming electron and X-ray. This setup keeps all detected events and allows for extensive post processing. By the measurement of every event, it is possible to disentangle the background from the coincidence signal opening up the possibility of background free EELS and EDX with EELS resolution.

[1] D. Jannis, K. Müller-Caspary, A. Béché A. Oelsner and J. Verbeeck. Unpublished Paper, 2018.

[2] D.J., A.B. and J.V. acknowledge funding from the Flemish Research Fund FWO under projectno. G093417N