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MA: Fachverband Magnetismus

MA 15: Magnetism Poster A

MA 15.72: Poster

Dienstag, 2. April 2019, 10:00–13:00, Poster E

Correlating structural and magnetic properties of polycrystalline exchange bias systems — •Maximilian Merkel¹, Jonas Zehner², Karin Leistner², Dennis Holzinger¹, and Arno Ehresmann¹ — ¹Institute of Physics and Center for Interdisciplinary Nanostructure Science and Technology (CINSaT), University of Kassel, Heinrich-Plett-Str. 40, D-34132 Kassel — ²Leibniz Institute for Solid State and Materials Research Dresden, IFW Dresden, Helmholtzstr. 20, D-01069 Dresden

Magnetic properties of sputter-deposited polycrystalline exchange bias thin films evolve from a complex interplay of different individual magnetic anisotropies which are directly connected to the grain size distribution, crystallite texture and interface structure of the layer system. These structural characteristics can be controlled via deposition parameters or manipulated during a thermal activation procedure in an external magnetic field. Angular-resolved hysteresis measurements using Kerr magnetometry in comparison to an extended Stoner-Wohlfarth model [1], X-ray diffraction experiments and interface roughness characterization allowed for the quantification of material properties in dependence of the layer thickness, deposition parameters and the field cooling temperature, supporting common structure zone models.

[1] Müglich, N. D., Gaul, A., Meyl M., Ehresmann, A. , Götz, G., Reiss, G., Kuschel T., Time-dependent rotatable magnetic anisotropy in polycrystalline exchange-bias systems: Dependence on grain-size distribution, Physical Review B 94, 184407 (2016)