Regensburg 2019 – wissenschaftliches Programm
Bereiche | Tage | Auswahl | Suche | Aktualisierungen | Downloads | Hilfe
MA: Fachverband Magnetismus
MA 15: Magnetism Poster A
MA 15.83: Poster
Dienstag, 2. April 2019, 10:00–13:00, Poster E
X-ray resonant magnetic reflectometry (XRMR) study of the interface between ferromagnetic transition metals and MgO — Daan Benjamin Boltje1,2, •Sven Erik Ilse1, Gisela Schütz1, and Eberhard Goering1 — 1Max Planck Institute for Intelligent Systems, Stuttgart, Germany — 2Delmic BV, Delft, Netherlands
Multilayer systems of ferromagnetic transition metals and MgO attract a lot of attention in the last years because of their application in STT-MRAMs. The chemical and magnetic properties at the interface between the transition metal and MgO are of exceptional interest in STT-MRAM cells. Those properties determine for example the strength of the interfacial perpendicular magnetic anisotropy and the thickness of possible magnetic dead layers, which are important parameters for the performance of MRAMs. With X-ray resonant magnetic reflectometry (XRMR) we combine the advantages reflectometry and X-ray magnetic circular dichroism (XMCD). Thus, we are able to determine element specific chemical and magnetic depth profiles including roughness at interfaces with XRMR. We performed X-ray absorption spectroscopy (XAS), XMCD and XRMR measurements on Ta|CoFeB|MgO|Al2O3|Au stacks. The chemical depth profile revealed a pronounced roughness at the Ta|CoFeB interface and that especially Fe intermixes largely with other species at the interfaces. The magnetic depth profile revealed a 10 Å and a 4 Å thick magnetic dead layer for Fe and Co, respectively, at the CoFeB|MgO interface.