Regensburg 2019 – scientific programme
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MA: Fachverband Magnetismus
MA 44: Magnetic imaging (Experimental techniques)
MA 44.5: Talk
Thursday, April 4, 2019, 10:30–10:45, H53
A new scanning reflection x-ray microscope for magnetic imaging in the EUV range — •Andreas Schümmer1, Hans-Christoph Mertins1, Claus Michael Schneider2, Roman Adam2, Daniel Bürgler2, Larissa Juschkin3, and Ulf Berges4 — 1University of Applied Sciences, Münster Stegerwaldstraße 39, 48565 Steinfurt, Germany — 2Forschungszentrum Jülich, Wilhelm-Johnen-Straße, 52428 Jülich, Germany — 3Rhein Westfälische Technische Hochschule Aachen, Templergraben 55, 52062 Aachen, Germany — 4TU Dortmund, Zentrum für Synchrotronstrahlung, Maria-Goeppert-Mayer-Str. 2, 44227 Dortmund, Germany
The advancing miniaturization in magnetic data storage and spintronics requires imaging characterization methods that can also investigate buried layers with element-selectivity and high sensitivity. Here, first magnetic domain images obtained with a new scanning reflection x-ray microscope (SRXM) are presented. Free standing zone plates and a scanning device were developed for the extreme ultra violet (EUV) range available at the beamline 12 at the DELTA synchrotron facility. The transversal magneto optical Kerr effect (T-MOKE) at the Fe 3p edge under 30° grazing incidence was applied to imaging the magnetic domain structure of buried Fe layers in Au/Fe/Cr-wedge/Fe/Ag samples, where the Cr thickness varies between 0.3 and 0.7 nm and thus gives rise to a transition between antiferromagnetic and ferromagnetic magnetic interlayer coupling between the Fe layers. The advantage of working in the EUV range is an increased intensity of the reflected light, which is about 2 orders of magnitude larger than at the 2p edges.