Regensburg 2019 – scientific programme

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MM: Fachverband Metall- und Materialphysik

MM 15: Topical session (Symposium MM): Correlative and in-situ Microscopy in Materials Research

MM 15.5: Talk

Tuesday, April 2, 2019, 12:15–12:30, H44

Nanoscale Characterization of Energy Materials using SIMS based Correlative Microscopy — •Santhana Eswara, Alisa Pshenova, Jean-Nicolas Audinot, and Tom Wirtz — Advanced Instrumentation for Ion Nano-Analytics, MRT, Luxembourg Institute of Science and Technology, L-4422 Belvaux, Luxembourg

Energy materials play a key role in providing sustainable and eco-friendly energy solutions. To improve the efficiency of energy conversion and storage, modern materials are being increasingly designed at the nanoscale and the chemical compositions are tuned even down to the dopant level. Therefore, nanoscale high-sensitivity chemical analyses are required for (i) establishing the link between local nanoscale characteristics of the material and the overall device performance and (ii) to develop new strategies to enhance performance and improve durability. Our research on this subject is focused on addressing the associated analytical challenges. While Transmission Electron Microscopy (TEM) offers high spatial resolution, the conventional analytical techniques available in TEM are inadequate for the analysis of light elements (H, B, Li) and dopant-level concentrations. Secondary Ion Mass Spectrometry (SIMS) offers high-sensitivity and all elements can be analyzed, but, the lateral resolution is fundamentally limited by ion-solid interaction volume to ~ 10 nm. To overcome this limitation, we use correlative TEM-SIMS [1] to investigate (i) silicon solar cell materials and (ii) electrodes in lithium battery materials. The results, correlative workflow, data treatment methods and potential artefacts will be discussed. [1] L. Yedra et al, Sci. Rep. 6, 28705, 2016