Regensburg 2019 – wissenschaftliches Programm
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MM: Fachverband Metall- und Materialphysik
MM 15: Topical session (Symposium MM): Correlative and in-situ Microscopy in Materials Research
MM 15.7: Vortrag
Dienstag, 2. April 2019, 12:45–13:00, H44
Structural Characterization of the 2D-Powder Material DRCN5T:PC71BM Using X-rays — •Marvin Berlinghof1, Stefan Langner1, Christina Harreiß1, Ella M. Schmidt1, Rita Siris2, Florian Bertram3, Johannes Will1, Stefanie Rechberger1, Georg S. Duesberg2, Reinhard B. Neder1, Erdmann Spiecker1, Christoph J. Brabec1, and Tobias Unruh1 — 1Friedrich-Alexander-Universität Erlangen-Nürnberg, Erlangen, Deutschland — 2Universität der Bundeswehr München, Neubiberg, Deutschland — 3Deutsches Elektronen-Synchrotron, Hamburg, Deutschland
The crystallinity and with it the power conversion efficiency (PCE) of organic photovoltaic thin films made of small molecule-fullerene-blends is tune-able by solvent vapor annealing (SVA). An example of such a system are thin films of DRCN5T:PC71BM. The small molecule DRCN5T crystallizes during annealing with vapors of chloroform, tetrahydrofuran or carbon disulfide. Its crystallites are formed at the surface of the thin film as a 2D powder (oblique crystal system). In the crystallites, DRCN5T assembles itself in stacks, which form the 2D crystalline structure.
A comparison of in- and ex-situ grazing wide angle X-ray scattering (GIWAXS), X-ray pole figures, elastic electron diffraction, and secondary ion mass spectrometry (SIMS) measurements will be presented. This includes information about, the crystalline structure, preferred orientations, and the vertical composition of the photoactive layer.