Regensburg 2019 – scientific programme
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MM: Fachverband Metall- und Materialphysik
MM 24: Topical session (Symposium MM): Correlative and in-situ Microscopy in Materials Research
MM 24.5: Topical Talk
Wednesday, April 3, 2019, 11:45–12:15, H45
Pathing the way to unique, nondestructive 3D-microstructure properties by in situ Laue tomography — Jean-Baptiste Molin1, Loic Renversade2,3, Jean-Sebastien Micha2,3, and •Christoph Kirchlechner1 — 1Max-Planck-Institut für Eisenforschung GmbH — 2Univ. Grenoble Alpes, CNRS, CEA, INAC-SyMMES, — 3CRG-IF BM32, ESRF, BP 220
Interlinking the mechanical properties of materials to their underlying and evolving microstructure is vital for a mechanism-based understanding of deformation, in particular at the micron scale. Numerous characterization tools, like scanning electron microscopy (SEM), transmission electron microscopy (TEM) as well as synchrotron based Laue microdiffraction (Laue) offer a complementary toolbox being well suited to answer most questions in material science today.
However, the current toolbox is either limited to surface information (e.g. SEM), thin samples (TEM) or integrated information (Laue). To close this gap we have combined a DAXM setup with a nanoindenter at BM32 of the European Synchrotron (ESRF). The talk will primarily focus on the experimental aspects of this unique machine including its experimental limits as well as prospects of future use.