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MM: Fachverband Metall- und Materialphysik

MM 35: Topical session (Symposium MM): Correlative and in-situ Microscopy in Materials Research

Donnerstag, 4. April 2019, 10:15–13:00, H45

Sessions: Surfaces and Interfaces; Thin Films and Nanostructures

	10:15	MM 35.1	Topical Talk: Friction mechanisms revealed by scanning force and electron microscopy — •Roland Bennewitz, Christiane Petzold, Marcus Koch, Nicholas Chan, SG Balakrishna, Philip Egberts, Andreas Klemenz, and Michael Moseler
	10:45	MM 35.2	Characterization of surface reactions by non-contact atomic force microscopy with functionalized tips — •Andreas Dörr, Maximilian Ammon, Van-Dong Pham, Milan Kivala, and Sabine Maier
	11:00	MM 35.3	Mesoscopic THz imaging of quantum materials - The instrument perspective — •Marc Westig, Holger Thierschmann, Allard Katan, Matvey Finkel, and Teun M. Klapwijk
	11:15		30 min. break
	11:45	MM 35.4	Topical Talk: In-situ Microscopy Testing of Metallic Thin Films — •Velimir Radmilović
	12:15	MM 35.5	Correlative in situ microscopy studies of highly directional nanowires — •Lilian Vogl, Peter Schweizer, Mingjian Wu, and Erdmann Spiecker
	12:30	MM 35.6	Correlative TEM and XRD study of the role of Au on the solid state dewetting behavior of Au/Ni bilayers on α-Al2O3 — •Johannes Will, Patrick Herre, Tobias Zech, Johanna Schubert, Mingjian Wu, Tadahiro Yokosawa, Jan Schwenger, Stefan Romeis, Dong Wang, Tobias Unruh, Wolfgang Peukert, and Erdmann Spiecker
	12:45	MM 35.7	In situ TEM observation of phase decomposition in NiAu nanoparticles derived from solid-state dewetting of bilayer metal thin films — •Johanna Schubert, Christian Wiktor, Simon Kraschewski, Patrick Herre, Mingjian Wu, Wolfgang Peukert, and Erdmann Spiecker