Regensburg 2019 – wissenschaftliches Programm

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MM: Fachverband Metall- und Materialphysik

MM 39: Structural Materials (Steels, light-weight materials, high-temperature materials)

MM 39.5: Vortrag

Donnerstag, 4. April 2019, 16:45–17:00, H45

Atomic force microscopy based electrical characterization of multiphase intermetallic TiAl alloys — •Markus Kratzer¹, Michael Huszar¹, Lisa Tengg², Helmut Clemens², Svea Mayer² und Christian Teichert¹ — ¹Institute of Physics, Montanuniversitaet Leoben, 8700 Leoben, Austria — ²Department of Physical Metallurgy and Materials Testing, Montanuniversitaet Leoben, 8700 Leoben, Austria

Atomic force microscopy - a powerful tool for the characterization of surface morphologies on the meso- and nanoscale - is also applicable for the investigation of local microscale electrical properties. This is demonstrated for an intermetallic TiAl alloy. Due to their high creep resistance, low density, and high specific strength TiAl alloys are promising materials for high-temperature structural parts in advanced propulsion systems. However, besides the mechanical parameters also the electrical behaviour of the alloys and its constituting phases are of importance. For example, the electrical homogeneity of the material is of interest for the proper interpretation of the results form electrical test procedures like, e.g., eddy current testing. TiAl samples comprising three different crystallographic phases were investigated utilizing Conductive Atomic Force Microscopy (C-AFM) to reveal local conductivity variations on the surface. Complementary, local differences in the work function were mapped using Kelvin Probe Force Microscopy (KPFM). Local current-to-voltage characteristics of the existing micrometer sized phases, recorded by C-AFM, indicated significant differences in the electrical conductivity between the individual phases.