Regensburg 2019 – wissenschaftliches Programm

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MM: Fachverband Metall- und Materialphysik

MM 6: Topical session (Symposium MM): Correlative and in-situ Microscopy in Materials Research

MM 6.1: Topical Talk

Montag, 1. April 2019, 11:45–12:15, H44

Break through new materials characterization frontiers with Atom Probe Microscopy — •François Vurpillot, Benjamin Klaes, Rodrigue Larde, Stefan Parviainen, and Bertrand Radiguet — Normandie Université, UNIROUEN, INSA Rouen, CNRS, Groupe de Physique des Matériaux, 76000 Rouen, France

Atom Probe Microscopy (APM) was proposed in 2012 [1] as a term that embraces the various techniques that derive from field emission generated by tip-like specimen. The most popular and fashion technique of APM is certainly the Atom Probe Tomography (APT) as evidenced by the dramatic increase in the number of books and publications in this field [1-4]. If now APT has its place among the panel of microscopy techniques, this instrument reaches its frontiers due in part to instrumental limitations, but more fundamentally intrinsic physical limitations. Break through these frontiers is however possible by correlating experimental data with accurate modelling and simulation approaches. This presentation will focus on different examples showing the capabilities of APM to image atomic defects in 3D and in the real space. The impact of the stress induced by the high field application is discussed from the quantum scale to the mesoscopic scale.

[1]*B. Gault et al., Atom Probe Microscopy, Springer, 2012. [2]*Lefebvre et al., Atom Probe Tomography Put Theory Into Practice, Academic Press, 2016. ; Larson et al.., Local Electrode Atom Probe Tomography, A User's Guide, Springer, 2013 ; Miller and Forbes, Atom-Probe Tomography, The Local Electrode Atom Probe, Springer, 2014