Regensburg 2019 – scientific programme
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MM: Fachverband Metall- und Materialphysik
MM 6: Topical session (Symposium MM): Correlative and in-situ Microscopy in Materials Research
Monday, April 1, 2019, 11:45–13:15, H44
Advanced Characterization I
11:45 | MM 6.1 | Topical Talk: Break through new materials characterization frontiers with Atom Probe Microscopy — •François Vurpillot, Benjamin Klaes, Rodrigue Larde, Stefan Parviainen, and Bertrand Radiguet | |
12:15 | MM 6.2 | Determination of 3D electrostatic field at an electron nano-emitter — •Mingjian Wu, Alexander Tafel, Peter Hommelhoff, and Erdmann Spiecker | |
12:30 | MM 6.3 | Cryo-atom probe tomography for in-situ diffusion measurement of H at crystal defects — •Peter Felfer | |
12:45 | MM 6.4 | Atom Probe Tomography for Thermoelectric Materials — •Yuan Yu, Oana Cojocaru-Mirédin, and Matthias Wuttig | |
13:00 | MM 6.5 | Magic Colloidal Clusters: 3D Investigation of Self-assembled Polystyrene Particles forming Agglomerations in Crystalline Order using X-Ray Nano- and Electron Tomography — •Silvan Englisch, Janis Wirth, Thomas Pryzbilla, Benjamin Apeleo Zubiri, Junwei Wang, Nicolas Vogel, and Erdmann Spiecker | |