Regensburg 2019 – scientific programme

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MM: Fachverband Metall- und Materialphysik

MM 9: Topical session (Symposium MM): Correlative and in-situ Microscopy in Materials Research

MM 9.2: Talk

Monday, April 1, 2019, 16:15–16:30, H44

Scanning Transmission Electron Beam Induced Current Combined with Spectroscopy for Investigating Energy Conversion in Nanoscale Materials — •Tobias Meyer¹, Birte Kressdorf², Jonas Lindner², Patrick Peretzki¹, Vladimir Roddatis², Christian Jooss², and Michael Seibt¹ — ¹4th Institute of Physics: Solids and Nanostructures, University of Goettingen, Friedrich-Hund-Platz 1, 37077 Goettingen, Germany — ²Institute of Materials Physics, University of Goettingen, Friedrich-Hund-Platz 1, 37077 Goettingen, Germany

Electron Beam Induced Current (EBIC) is a well-established, powerful characterisation tool in semiconductor physics which has been employed in Scanning Electron Microscopes (SEM) for decades, e.g. to map enhanced excess carrier recombination at crystal imperfections. Despite great advancements in instrumentation, the resolution of SEM based setups is rather limited since multiple scattering of the impinging electrons leads to a pear-shaped generation volume and hence a sophisticated crosstalk between primary excitations and the sample's geometry.

Transferring the technique to the Scanning Transmission Electron Microscope (STEM), also referred to as Scanning Transmission EBIC (STEBIC), prevents the electron beam to spread significantly before exiting the sample. Thus, excess carrier dynamics on the nanometer scale become accessible and can additionally be correlated to state of the art STEM signals like Electron Energy Loss Spectra (EELS) and Nano Beam Electron Diffraction (NBED) patterns.