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MM: Fachverband Metall- und Materialphysik

MM 9: Topical session (Symposium MM): Correlative and in-situ Microscopy in Materials Research

MM 9.4: Vortrag

Montag, 1. April 2019, 16:45–17:00, H44

Simulation of fluctuation electron microscopy data: the Ka-Xi plot — •Martin Peterlechner, Sven Hilke, and Gerhard Wilde — Institute of Materials Physics, University of Münster, Münster, Germany

The method of fluctuation electron microscopy (FEM), as introduced by Treacy and Gibson, is an excellent tool for analysis of amorphous materials. The signal of the ring intensity variation in a nano-beam diffraction pattern (NBDP) along constant k-values ('Ka' values) is very sensitive to structural changes in the medium range order length scale. To understand the signal and gain knowledge on the sensitivity, we simulated NBDPs by a recently in-house developed multislice algorithm, STEMcl. For every beam position during a scanning transmission electron microscopy (STEM) experiment, the corresponding NBDP was segmented into 150 rings. The 150 corresponding STEM images were calculated, and the profiles of their Fouriertransforms were analysed ('Xi' space). The so obtained 'Ka-Xi' plots are analysed, and conclusions about optimum experimental conditions and the sensitivity of FEM in general are discussed.