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MM: Fachverband Metall- und Materialphysik

MM 9: Topical session (Symposium MM): Correlative and in-situ Microscopy in Materials Research

MM 9.6: Topical Talk

Montag, 1. April 2019, 17:30–18:00, H44

High resolution X-Ray Imaging at the Swiss Light Source in 2D and 3D — •Jörg Raabe — Paul Scherrer Institut, Villigen, Schweiz

Synchrotron based x-ray microscopy provide versatile tools for material science research. Recent Hard x-ray based tomographic Instruments at the Swiss Light Source (SLS) achieve resolutions below 15nm in 3D. This will be illustrated by different applications examples. The second presented instrument is the PolLux beamline of the SLS, focusing on soft x-ray microscopy providing elemental, chemical and magnetic contrast combined with a temporal resolution down to 100ps.