Regensburg 2019 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 10: New Methods and Developments II: Scanning Probe, Spectroscopic, and Diffraction Techniques
O 10.7: Vortrag
Montag, 1. April 2019, 16:30–16:45, H3
Soft x-ray RIXS-Imaging of thin microstructured VO2 — •Jan Oliver Schunck1,2, Florian Döring3, Benedikt Rösner3, Jens Buck1, Sanjoy Mahatha1, Moritz Hoesch1, Christian Schüßler-Langeheine4, Adrian Petraru5, Hermann Kohlstedt5, Kai Rossnagel1,6, Christian David3, and Martin Beye1,2 — 1Deutsches Elektronen-Synchrotron DESY, Hamburg — 2Physics Department, Universität Hamburg — 3Paul Scherrer Institut, Villigen, Switzerland — 4Helmholtz-Zentrum Berlin — 5Nanoelektronik, Technische Fakultät, CAU Kiel — 6Institut für Experimentelle und Angewandte Physik, CAU Kiel
This contribution presents the results of imaging Resonant Inelastic X-ray Scattering (RIXS) measurements performed on vanadium dioxide samples at the soft x-ray synchrotron beamline P04 at PETRA III in Hamburg, where a new experimental setup was employed [1]. Instead of averaging over µm-sized x-ray spot foci on the sample, the incident x-rays were focussed to a vertical line, along which the photon energy varied due to the dispersion of the beamline. Furthermore, an off-axis Fresnel zone plate was employed, dispersing the emitted photon energies in horizontal direction onto a CCD camera while imaging the sample in vertical direction. This enables the in-parallel recording of RIXS maps of emitted intensities depending on incident and emitted photon energies. Additionally, scanning the 1D imaged line focus across the sample in perpendicular direction facilitates the recording of 2D images of electronic properties with a spatial resolution of about 2 µm.
[1] F.Marschall et al., Scientific Reports 7, 8849 (2017).