Regensburg 2019 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 10: New Methods and Developments II: Scanning Probe, Spectroscopic, and Diffraction Techniques

O 10.8: Vortrag

Montag, 1. April 2019, 16:45–17:00, H3

Using X-Ray Cavities for the Enhancement of RIXS Signal Levels — •Robin Yoël Engel¹, Lars Bocklage¹, Simo Huotari², Hasan Yavas³, Marco Moretti Sala⁴, Piter Miedama¹, Gyoergy Vanko⁵, Ralf Röhlsberger¹, and Martin Beye¹ — ¹DESY, Hamburg, Germany — ²Dep. of Phys., University Helsinki, Finland — ³LCLS, SLAC, Menlo Park, USA — ⁴Dep. of Phys., Politecnico di Milano, Italy — ⁵Wigner RCP, Budapest, Hungary

While Resonant Inelastic X-ray Scattering (RIXS) is a powerful analytic tool for the analysis of material functionality, achieving adequate signal levels is one of the main challenges for experiments. This difficulty lies in the low probability of the inelastic scattering process (J. Synchrotron Rad. (2018). 25, 580-591) combined with the fact that most spectrometers only cover a small part of the solid angle opposed to the quasi-isotropically emitted fluorescence photons. Here, we show a method to significantly increase signal levels by embedding probe layers, in this case thin iron and iron oxide, into a grown multilayer system, which acts as a resonant cavity at specific incident angles. This brings two advantages: First, the standing waves within the cavity exhibit strongly enhanced electric field amplitudes, thus increasing the total fluorescence yield correspondingly. Further, the cavities resonance condition focuses the fluorescence photons into specific emission angles. This talk presents preliminary results of an experiment performed at the ESRF, demonstrating the expected resonant cavity effects, leading to a five-fold enhancement in signal due to the focusing of fluorescence photons on top of the effect of enhanced excitation.