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O: Fachverband Oberflächenphysik

O 34: New Methods and Developments III: Spectroscopy and Tribology

O 34.6: Vortrag

Dienstag, 2. April 2019, 15:15–15:30, H13

Removing Photoemission Features from Auger-yield NEXAFS Spectra — •Ole Lytken, Daniel Wechsler, and Hans-Peter Steinrück — Universität Erlangen-Nürnberg

Auger-yield is widely used for surface-sensitive NEXAFS measurements, but suffers from errors introduced by photoemission features travelling through the measured Auger peaks. We will present two-dimensional NEXAFS images, measured at the Materials Science beamline at Elettra in Trieste, and a procedure for removing the photoemission features travelling through the images. The procedure relies on describing the measured Auger-yield NEXAFS images as three simple, one-dimensional spectra: NEXAFS, Auger and XPS, which are extracted through an iterative process. The procedure requires no additional reference measurements other than photon flux and the success of the cleanup process is easily verified by the resulting images.